By Dimitris Gizopoulos
This is a brand new kind of edited quantity within the Frontiers in digital checking out e-book sequence dedicated to contemporary advances in digital circuits checking out. The booklet is a accomplished elaboration on very important issues which trap significant examine and improvement efforts this day. "Hot" issues of present curiosity to check know-how neighborhood were chosen, and the authors are key participants within the corresponding topics.
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Extra resources for Advances in Electronic Testing: Challenges and Methodologies
It increases as channel length shrinks and also strongly varies with increasing temperature. 11 Gate leakage is conduction across the oxide of a transistor between the gate and substrate. It increases as oxide thickness decreases, and has much less temperature dependence than subthreshold leakage. 28 Chapter 1 – Defect-Oriented Testing practical as a production test, but even for these chips it remains an effective diagnosis tool. off 1 0 B on A off 0 1 Figure 1-23: Leakage induced faulty latch behavior.
It is instructive to look at the data in the same Venn diagram format as the HP data (see Figure 1-29).
Hammerheads or outriggers) or shrink features. OPC leads to two major classes of defect: mask errors and Design Rule Checking 5 (DRC) escapes. In a mask error (see Figure 1-8), OPC fixes result in a short or open when features interfere with one another. In general, mask defects are catastrophic and result in 100% yield loss simply because all chips manufactured using the bad masks will be faulty. Reticle inspection helps reduce the number of these, but inspection programs have been confused by OPC features that look like defects but are legitimately needed for the design .
Advances in Electronic Testing: Challenges and Methodologies by Dimitris Gizopoulos