Download PDF by Dimitris Gizopoulos: Advances in Electronic Testing: Challenges and Methodologies

By Dimitris Gizopoulos

ISBN-10: 0387294082

ISBN-13: 9780387294087

This is a brand new kind of edited quantity within the Frontiers in digital checking out e-book sequence dedicated to contemporary advances in digital circuits checking out. The booklet is a accomplished elaboration on very important issues which trap significant examine and improvement efforts this day. "Hot" issues of present curiosity to check know-how neighborhood were chosen, and the authors are key participants within the corresponding topics.

Show description

Read or Download Advances in Electronic Testing: Challenges and Methodologies PDF

Similar products books

EMC for Product Designers - download pdf or read online

Commonly considered as the normal textual content on EMC, Tim Williams' booklet presents all of the details essential to meet the necessities of the EMC Directive. most significantly, it indicates tips on how to comprise EMC layout rules into items, fending off rate and function consequences, assembly the desires of particular criteria and leading to a greater total product.

Download e-book for iPad: Practical Electronics Handbook by Ian Sinclair

This can be the simplest worth guide on electronics you should purchase. With new chapters and sections masking subject matters reminiscent of sensing elements, connectors, soldering and unsoldering, this fourth version includes all the daily details that anybody operating in electronics will want. It presents a pragmatic and entire selection of circuits, ideas of thumb and layout info for pro engineers, scholars and fanatics, and for that reason sufficient historical past to permit the certainty and improvement of quite a number uncomplicated circuits.

Read e-book online Scaling Chemical Processes. Practical Guides in Chemical PDF

Scaling Chemical procedures: functional publications in Chemical Engineering is certainly one of a chain of brief texts that every presents a targeted introductory view on a unmarried topic. the complete library spans the most subject matters within the chemical method industries for engineering execs who require a easy grounding in a number of comparable issues.

Extra resources for Advances in Electronic Testing: Challenges and Methodologies

Example text

It increases as channel length shrinks and also strongly varies with increasing temperature. 11 Gate leakage is conduction across the oxide of a transistor between the gate and substrate. It increases as oxide thickness decreases, and has much less temperature dependence than subthreshold leakage. 28 Chapter 1 – Defect-Oriented Testing practical as a production test, but even for these chips it remains an effective diagnosis tool. off 1 0 B on A off 0 1 Figure 1-23: Leakage induced faulty latch behavior.

It is instructive to look at the data in the same Venn diagram format as the HP data (see Figure 1-29).

Hammerheads or outriggers) or shrink features. OPC leads to two major classes of defect: mask errors and Design Rule Checking 5 (DRC) escapes. In a mask error (see Figure 1-8), OPC fixes result in a short or open when features interfere with one another. In general, mask defects are catastrophic and result in 100% yield loss simply because all chips manufactured using the bad masks will be faulty. Reticle inspection helps reduce the number of these, but inspection programs have been confused by OPC features that look like defects but are legitimately needed for the design [7].

Download PDF sample

Advances in Electronic Testing: Challenges and Methodologies by Dimitris Gizopoulos


by Brian
4.1

Rated 4.03 of 5 – based on 12 votes